The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Aug. 09, 2019
Applicant:
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Inventors:
Hyun Wook Park, Daejeon, KR;
Byung Jai Kim, Daejeon, KR;
Assignee:
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5605 (2013.01); G01R 33/5612 (2013.01); G01R 33/5614 (2013.01);
Abstract
Disclosed is an image acquisition method and apparatus using a parallel scheme of radio frequency irradiation and data acquisition. The image acquisition method includes saturating a labile proton by radiating a first radio frequency (RF) pulse signal to an object, generating a proton signal by radiating a pulse sequence signal to the object, and obtaining a chemical exchange saturation transfer (CEST) image of the object, and the generating and the obtaining of which are repeatedly performed in parallel.