The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Dec. 18, 2018
Applicant:

Spire Manufacturing, Inc., Fremont, CA (US);

Inventors:

Hai Dau, San Ramon, CA (US);

Lim Hooi Weng, Singapore, SG;

Kothandan Shanmugam, Singapore, SG;

Christine Bui, Gilroy, CA (US);

Assignee:

Spire Manufacturing, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); H01R 12/52 (2011.01); G01R 31/28 (2006.01); G01R 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07378 (2013.01); G01R 3/00 (2013.01); G01R 31/2831 (2013.01); G01R 31/2834 (2013.01); H01R 12/52 (2013.01);
Abstract

In one embodiment, the present invention includes an interface assembly for a vertical probe contactor. The interface assembly comprises a base board, a mounting board, a depth adjust plate, and an interface apparatus. The depth adjust plate is between the base board and the mounting board, and the interface apparatus is mounted to the mounting board. The interface apparatus is configured to receive the vertical probe contactor through an opening in the base board and a corresponding opening in the depth adjust plate. A thickness of the depth adjust plate defines a vertical distance between a wafer side of the base board and a plurality of probe tips of the vertical probe contactor.


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