The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Jan. 23, 2018
Safran, Paris, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Ecole Superieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris, Paris, FR;
Aurélien Baelde, Moissy-Cramayel, FR;
Frédéric Jenson, Moissy-Cramayel, FR;
Mathias Fink, Meudon, FR;
Jérôme Laurent, Paris, FR;
Claire Prada, Paris, FR;
SAFRAN, Paris, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
ECOLE SUPERIEURE DE PHYSIQUE ET DE CHIMIE, Paris, FR;
INDUSTRIELLES DE LA VILLE DE PARIS, Paris, FR;
Abstract
A method for nondestructively testing a part comprising an elongate microstructure is disclosed. The method comprises: moving a linear transducer to a plurality of positions located facing a surface of the part, the linear transducer comprising a plurality of transducer elements that are aligned along a main direction; emitting a plurality of elementary ultrasonic beams, each of the plurality of elementary ultrasonic beams being emitted by each of the plurality of transducer elements in the direction of the surface; measuring a plurality of echo signals and a plurality of structural noises, each of the plurality of echo signals and each of the plurality of structural noises being measured by each of the plurality of transducer elements, each of the echo signals resulting from the backscatter of the elementary ultrasonic beams by a defect under the surface of the part, and each of the structural noises resulting from the backscatter of the elementary ultrasonic beams by the elongate microstructure; and determining a direction of elongation of the elongate microstructure when an amplitude of one among the plurality of measured structural noises is minimal in the plurality of positions. Furthermore, a non-destructive testing system for implementing the testing method is disclosed.