The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Sep. 08, 2017
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Richa Sharma, Cambridge, MA (US);

Raji Shankar, Cambridge, MA (US);

Terizhandur S. Ramakrishnan, Boxborough, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/552 (2014.01); G01N 21/41 (2006.01); G01N 21/3577 (2014.01); E21B 49/08 (2006.01); G01N 21/17 (2006.01); E21B 49/10 (2006.01); G01N 21/43 (2006.01);
U.S. Cl.
CPC ...
G01N 21/552 (2013.01); G01N 21/41 (2013.01); E21B 49/081 (2013.01); E21B 49/10 (2013.01); G01N 21/3577 (2013.01); G01N 21/431 (2013.01); G01N 2021/1751 (2013.01); G01N 2021/1755 (2013.01);
Abstract

Methods and apparatus are provided for determining the refractive index of a downhole fluid. Two unalike crystals are provided having faces in contact with fluid in the fluid flow line of a borehole tool. The crystals are chosen to have different refractive indices and/or different angles of incidence, but to provide total internal reflection for light that is directed through the crystals to the crystal/fluid interface. The measured attenuations for each crystal are used in conjunction with the known refractive indices and angles of incidence of said crystals to determine the refractive index of the fluid.


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