The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Oct. 03, 2019
Korea University Research and Business Foundation, Seoul, KR;
Institute for Basic Science, Daejeon, KR;
Won-Shik Choi, Seoul, KR;
Moon-Seok Kim, Seoul, KR;
Yong-Hyeon Jo, Seoul, KR;
Seok-Chan Yoon, Seoul, KR;
Korea University Research and Business Foundation, Seoul, KR;
Institute For Basic Science, Daejeon, KR;
Abstract
The present invention relates to a high-speed imaging system for measuring a target object within a sample, comprising: a light source emitting a plane wave; an angle-adjustment mirror adjusting an angle of the plane wave emitted from the light source; an optical interferometer dividing the plane wave whose angle was adjusted by the angle-adjustment mirror into a reference wave and a sample wave and forming an interference wave between the reference wave reflected from a reference mirror and the sample wave reflected from the target object; a camera module obtaining the interference wave, and an imaging controller controlling the angle-adjustment mirror to adjust the angle of the plane wave sequentially, forming a time-gated reflection matrix by using the interference waves obtained by the camera module in accordance with each angle of the plane wave, and imaging the target object based on the time-gated reflection matrix.