The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
May. 17, 2019
Northrop Grumman Systems Corporation, Falls Church, VA (US);
Michael M. Fitelson, Columbia, MD (US);
Jane Sprigg, Catonsville, MD (US);
Eduard Y. Luzhanskiy, Ellicott City, MD (US);
George R. Gray, Eldersberg, MD (US);
Scott Kelber, Columbia, MD (US);
Northrop Grumman Systems Corporation, Falls Church, VA (US);
Tarsier Optics, Inc., Baltimore, MD (US);
Abstract
Intensity values of electromagnetic radiation from an object to be imaged are received from an array of detectors. The array of detectors includes one or more pairs of detectors arranged as antisymmetric pairs of detectors. A Fourier transform of an image of the object is determined by correlating fluctuations of the intensity values for each antisymmetric pair of detectors. An inverse of the Fourier transform is determined, and an image of the object is generated from the inverse Fourier transform. The Fourier transform of the mean intensity pattern across the array of detectors may also be used to determine when the array is properly oriented to separate the image and mirror image.