The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Feb. 05, 2021
Applicant:

Jinan University, Guangzhou, CN;

Inventors:

Mei Li, Guangzhou, CN;

Mengxi Wu, Guangzhou, CN;

Chunlei Cheng, Guangzhou, CN;

Assignee:

Jinan University, Guangzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 33/00 (2006.01); G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
G01N 15/02 (2013.01); G01N 15/06 (2013.01); G01N 33/0036 (2013.01);
Abstract

The present disclosure provides an online monitoring and source apportionment method for atmospheric particles containing heavy metals, and belongs to the technical field of online quantification and source tracing of atmospheric particles containing heavy metals. The single particle aerosol mass spectrometer and X-ray fluorescence spectrometer are combined to quickly determine the concentration, time series, chemical compositions and mixing state of atmospheric particles containing heavy metals from both qualitative and quantitative perspectives. A heavy metal-containing particle mass concentration limit system is incorporated into the X-ray fluorescence spectrometer. Once the mass concentration of a particle containing heavy metals exceeds the standard, the aerosol mass spectrometer can immediately receive this alert through the information transmission system. The online source tracing system of aerosol mass spectrometer will start immediately after receiving the signal of the heavy metal exceeding the standard.


Find Patent Forward Citations

Loading…