The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Jun. 27, 2017
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Falk Schlaudraff, Butzbach, DE;

Andrew K. Lee, Allen, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/28 (2006.01); G01J 1/42 (2006.01); G02B 21/08 (2006.01); A61B 18/20 (2006.01);
U.S. Cl.
CPC ...
G01N 1/286 (2013.01); A61B 18/20 (2013.01); G01J 1/4257 (2013.01); G02B 21/08 (2013.01); G01N 2001/2886 (2013.01);
Abstract

A method for performing a laser microdissection for cutting a dissectate from a specimen using a laser includes the step of providing the specimen in a light path of an illumination system. The specimen is illuminated by the illumination system. A detector detects light emanating from the specimen. The light detected by the detector is analyzed. It is determined, based on the analysis of the light detected by the detector, whether a receptacle for collecting the dissectate is disposed in a predetermined collection position, at which the dissectate is to be collected in the receptacle after it is cut from the specimen. Laser cutting of the dissectate from the specimen is initiated based on it having been determined that the receptacle is in the predetermined collection position.


Find Patent Forward Citations

Loading…