The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Feb. 15, 2018
Applicant:

Continuse Biometrics Ltd., Tel Aviv, IL;

Inventors:

Zeev Zalevsky, Rosh HaAyin, IL;

Haim Goldenfeld, Rishon Le Zion, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 5/00 (2006.01); A61B 5/024 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02094 (2013.01); A61B 5/0066 (2013.01); A61B 5/024 (2013.01);
Abstract

A system for use in monitoring parameters of an object includes an illumination unit configured for providing coherent illumination of a predetermined wavelength range and for directing the coherent illumination onto an inspection region of the object, and a collection unit comprising a lens arrangement and a detector array and configured for collecting light returning from the inspection region and for generating one or more image data pieces associated with speckle patterns generated at an intermediate plane between the inspection region and the detector array. The detector array is configured as a rolling shutter type detector unit and the collection unit comprises at least one light splitting element configured for splitting collected light to thereby form a plurality of image replications corresponding to the speckle patterns on the detector array.


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