The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Feb. 27, 2017
Pellenc Selective Technologies (Societe Anonyme), Pertuis, FR;
Antoine Bourely, La Tour D'Aigues, FR;
Gwénaële Le Corre, Pertuis, FR;
PELLENC SELECTIVE TECHNOLOGIES (SOCIETE ANONYME), Pertuis, FR;
Abstract
A machine for automatically inspecting a flow (F) of individual objects () on a conveying plane () includes at least one illumination station () and at least one detection station (') below which the flow (F) of objects to be inspected passes. The at least one illumination station () has means () for applying and focusing inspecting beams (R) defining a transverse focused illuminated region (ZEF) The at least one detection station (′) has a means () defining a detection region (ZD) in the form of a transverse strip of size (L) as well as means () for capturing and transmitting the signal contained in a pixel () scanning the detection region (ZD). The focused illuminated region (ZEF) fits along the entire width (L) of the detection region (ZD) within this detection region.