The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Nov. 27, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jeong Yong Song, Bucheon-si, KR;

Byeong Won Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 5/00 (2006.01); G06N 3/04 (2006.01); A61B 6/03 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4014 (2013.01); A61B 6/4405 (2013.01); A61B 6/5282 (2013.01); A61B 6/5294 (2013.01); G06N 3/0454 (2013.01); G06T 5/002 (2013.01); G06T 5/003 (2013.01); A61B 6/03 (2013.01); A61B 6/04 (2013.01); A61B 6/462 (2013.01); A61B 6/465 (2013.01); A61B 6/5205 (2013.01); A61B 6/544 (2013.01); A61B 6/563 (2013.01); A61B 6/584 (2013.01); G06T 2207/20081 (2013.01);
Abstract

Disclosed herein is a method of acquiring a medical image of an X-ray apparatus, including: acquiring an original radiation image of a target object and capturing condition information of the object; acquiring a scatter radiation image related to the original radiation image by inputting the original radiation image and the capturing condition information to a learning network model configured to estimate scatter radiation; and acquiring a scatter radiation-processed medical image from the original radiation image on the basis of the original radiation image and the scatter radiation image, wherein the learning network model configured to estimate scatter radiation is a learning network model taught using a plurality of scatter radiation images and a plurality of pieces of capturing condition information related to each of the plurality of scatter radiation images.


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