The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Feb. 06, 2018
The Regents of the University of California, Oakland, CA (US);
Kenneth J. Loh, La Jolla, CA (US);
Sumit Gupta, La Jolla, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
Systems and methods for monitoring a change to a region of interest over time are disclosed. Exemplary embodiments may: (a) apply one or more layers of a stress-sensitive material to an object of interest; (b) incorporate the object of interest into a region of interest; (c) insert the region of interest with stress-sensitive material into an electrical capacitance tomography (ECT) device to interrogate the region of interest; (d) generate a first map of the region of interest based on captured information from the ECT device; (e) after a first length of time, repeat steps (c)-(d) to generate a second map of the region of interest; and (f) compare the first map to the second map to determine changes to the region of interest based on changes to the stress-sensitive material.