The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Jul. 11, 2019
Fanuc Corporation, Yamanashi, JP;
Junichirou Yoshida, Yamanashi, JP;
Shouta Takizawa, Yamanashi, JP;
Fanuc Corporation, Yamanashi, JP;
Abstract
An object inspection device capable of sharing an image or an inspection parameter for surface inspection of an object to be inspected among a plurality of object inspection devices. The object inspection device includes a camera, a robot relatively positioning the object and the camera, an index, and a controller controlling the camera and the robot. The controller is configured to control the robot to position the index and the camera at any relative position, cause the camera to image the index to acquire imaged data of the index, hold the robot at a position where the index is disposed at an index reference point in the image coordinate system based on the imaged data and coordinate data of the index reference point, and adjust an inspection position using the position of the robot at this time.