The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Mar. 25, 2020
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Wen-Ching Chou, Sunnyvale, CA (US);

Sandeep Krishnegowda, San Jose, CA (US);

Qamrul Hasan, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/72 (2013.01); H04L 9/30 (2006.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
H04L 63/166 (2013.01); G06F 21/72 (2013.01); H04L 9/3073 (2013.01); H04L 9/3242 (2013.01); H04L 63/0428 (2013.01);
Abstract

Disclosed are systems and methods for diagnosing the health of a plurality of memory cells in a memory array. Diagnostics are initiated from a remote server via an encrypted channel on the memory device embedded in an end-use system. The memory device includes a plurality of memory cells in a memory array. At the remote server, encrypted diagnostics data is received in response to execution of a diagnostics program by the memory device on the plurality of memory cells. The diagnostics data pertains to the health of the memory cells. The encrypted diagnostics data is decrypted into decrypted diagnostics data and the decrypted diagnostics data is analyzed to determine the health of the memory cells. Failure mitigation is performed for the memory device if the analyzing indicates unhealthy memory cells.


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