The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Apr. 03, 2020
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Carl J. Hahn, III, Inglewood, CA (US);

Jeffrey T. McCollam, Huntington Beach, CA (US);

Paul Christian Werntz, Long Beach, CA (US);

Assignee:

THE BOEING COMPANY, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/26 (2006.01); H04B 17/00 (2015.01); H04B 17/10 (2015.01); H04B 17/11 (2015.01); H04B 17/24 (2015.01); H04B 17/16 (2015.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H04B 17/0085 (2013.01); H04B 17/102 (2015.01); H04B 17/11 (2015.01); H04B 17/16 (2015.01); H04B 17/24 (2015.01);
Abstract

A near-field test system for a phased array antenna includes a probe, a beam forming network, and a computing system. The probe is disposed at a fixed position in a near-field of the antenna and is configured to receive at least a portion of a test beam radiated by the antenna. The beam forming network is coupled to the antenna and includes a plurality of phase shifters configured to steer the test beam to a position in the near-field when radiated by an array of antenna elements of the antenna. The computing system is coupled to the probe and is configured to normalize received power of the test beam based on the position of the beam in the near-field relative to the fixed position of the probe, and generate a far-field antenna pattern for the antenna from normalized received power of the test beam.


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