The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Oct. 28, 2016
Applicant:

Duke University, Durham, NC (US);

Inventors:

Zach Russell, Durham, NC (US);

Michael Gehm, Durham, NC (US);

Jeffrey T. Glass, Durham, NC (US);

Shane Di Dona, Durham, NC (US);

Evan Chen, Durham, NC (US);

Charles Parker, Durham, NC (US);

Jason Amsden, Durham, NC (US);

David Brady, Durham, NC (US);

Assignee:

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/32 (2006.01);
U.S. Cl.
CPC ...
H01J 49/322 (2013.01);
Abstract

Disclosed herein are mass spectrometers having segmented electrodes and associated methods. According to an aspect, an apparatus or mass spectrometer includes an ion source configured to generate ions from a sample. The apparatus also includes a detector configured to detect a plurality of mass-to-charge ratios associated with the ions. Further, the apparatus includes segmented electrodes positioned between the ion source and the detector. The apparatus also includes a controller configured to selectively apply a voltage across the segmented electrodes for forming a predetermined electric field profile.


Find Patent Forward Citations

Loading…