The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Nov. 30, 2017
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Takurou Iwasa, Tokyo, JP;

Ryuji Hashimoto, Tokyo, JP;

Masashi Ito, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01F 1/055 (2006.01); C22C 33/02 (2006.01); C22C 38/00 (2006.01); C22C 38/10 (2006.01); H01F 1/053 (2006.01);
U.S. Cl.
CPC ...
H01F 1/0557 (2013.01); C22C 33/02 (2013.01); C22C 38/005 (2013.01); C22C 38/10 (2013.01); H01F 1/0536 (2013.01); C22C 2202/02 (2013.01);
Abstract

A rare-earth sintered magnet contains main phase crystal grains having an Nd5Fe17-type crystal structure, includes R and T (where R represents one or more rare-earth elements that essentially include Sm and T represents Fe or one or more transition metal elements that essentially include Fe and Co), and wherein the compositional ratio of R is 20-40 at % and the remaining portion is substantially T; the remaining portion other than R is substantially only T or only T and C; and when the main phase crystal grains' average grain size in one cross-sectional surface of the rare-earth sintered magnet is defined as Dv, while grain size of individual main phase crystal grains is defined as Di, Dv is at least 1.0 μm, and the main phase crystal grains' area ratio that satisfy 0.7Dv≤Di≤2.0Dv is at least 80% with respect to the area of a cross-sectional surface of the rare-earth sintered magnet.


Find Patent Forward Citations

Loading…