The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Mar. 07, 2019
Jvc Kenwood Corporation, Kanagawa, JP;
Takashi Himukashi, Yokohama, JP;
JVCKENWOOD CORPORATION, Yokohama, JP;
Abstract
Provided is a shape measuring apparatus, a shape measuring method, and a program that can efficiently measure a three-dimensional shape of an object. The shape measuring apparatus includes an imaging unit, a distance image sensor unit, and a processing apparatus. The imaging unit acquires a two-dimensional image of an object over a plurality of frames. The distance image sensor unit acquires a distance image of the object over the plurality of frames. The processing apparatus detects a feature point of the object from the distance image of each of the plurality of frames and writes the detected feature point in a coordinate system set for the object.