The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Apr. 13, 2020
Faro Technologies, Inc., Lake Mary, FL (US);
Denis Wohlfeld, Ludwigsburg, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
A method and system for scanning and measuring an environment is provided. The method includes acquiring a first group of 3D coordinates of the area with a first 3D measurement device. The first 3D measurement device determines a distance to a surface in the area based at least in part on the speed of light. A second group of coordinates is acquired with a second measurement device while the first 3D measurement device is moved through the environment. The second measurement device being in a fixed relationship to the first 3D measurement device. The second measurement device determining a position of the second measurement device based on one or more points on the surface in the area based at least in part on a projected light. The first group of 3D coordinates is registered based at least in part the second group of coordinates.