The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Nov. 24, 2019
Applicant:
Chroma Ate Inc., Tao-Yuan, TW;
Inventors:
Assignee:
CHROMA ATE INC., Tao-Yuan, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/174 (2017.01); G06T 7/90 (2017.01); G06T 7/11 (2017.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/174 (2017.01); G06T 7/0002 (2013.01); G06T 7/11 (2017.01); G06T 7/90 (2017.01);
Abstract
An image inspection method includes capturing a target object image, which the target object image comprises a plurality of graphical features; choosing a block image comprising a specific graphical feature of the plurality of graphical features from the target object image; capturing all the graphical features of the block image to obtain a region of interest (ROI); executing a filtering process or a recovering process on the ROI to obtain a pre-processed region; and inspecting, according to the pre-processed region, the target object image to determine whether the target object image has defects.