The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Aug. 16, 2019
Optos Plc, Scotland, GB;
Peter Robert Wakeford, Dunfermline, GB;
David Clifton, Dunfermline, GB;
OPTOS PLC, Scotland, GB;
Abstract
A method, apparatus, and computer-readable medium, for assessing image quality of an image produced by a scanning imaging system. The method comprises acquiring (S) image data of an image produced by the scanning imaging system and calculating (Sto S), for each section of the image: a respective first value measuring at least one of sharpness or contrast of at least a part of the section, the measuring depending on noise, a respective second value measuring noise in at least a part of the section, and a respective third value indicating image quality, by combining the first and second values. The combining is such that calculated third values have a weaker dependency on the noise than the first values. The method further comprises determining (S) a quality score that is indicative of image quality of the image based on a variation of the calculated third values among the sections.