The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Jul. 09, 2019
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

Steven A. Israel, Fairfax, VA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06K 9/623 (2013.01); G06K 9/6256 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Discussed herein are architectures and techniques for improving execution or training of machine learning techniques. A method can include receiving a request for image data, the request indicating an analysis task to be performed using the requested image data, determining a minimum image quality score for performing the analysis task, issuing a request for image data associated with an image quality at last equal to, or greater than, the determined minimum image quality score, receiving, in response to the request, image data with an image quality score greater than, or equal to, the determined minimum image quality score, and providing the received image data to (a) a machine learning (ML) model executor to perform the image analysis task or (b) an ML model trainer that trains the ML model to perform the image analysis task.


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