The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Jun. 03, 2019
Applicant:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Inventors:

Mohsen Ghazel, Mississauga, CA;

Joseph Lam, North York, CA;

Qifeng Gan, Oakville, CA;

Kiril Lomakin, Toronto, CA;

Assignee:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/50 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6284 (2013.01); G06T 7/50 (2017.01); G06T 7/74 (2017.01); G06T 2207/10028 (2013.01);
Abstract

A method of detecting gaps on a support structure includes: obtaining, at an imaging controller, (i) a plurality of depth measurements representing the support structure according to a common frame of reference, and (ii) a plurality of label indicators each defining a label position in the common frame of reference; for each of the label indicators: classifying the label indicator as either a peg label or a shelf label, based on a portion of the depth measurements selected according to the label position and a portion of the depth measurements adjacent to the label position; generating an item search space in the common frame of reference according to the class of the label indicator; and determining, based on a subset of the depth measurements within the item search space, whether the item search space contains an item.


Find Patent Forward Citations

Loading…