The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Jun. 14, 2019
Shreyas Saxena, Mountain View, CA (US);
Wenda Wang, Mountain View, CA (US);
Guanhang Wu, Santa Clara, CA (US);
Nitish Srivastava, San Francisco, CA (US);
Dimitrios Kottas, Sunnyvale, CA (US);
Cuneyt Oncel Tuzel, Cupertino, CA (US);
Luciano Spinello, Sunnyvale, CA (US);
Ricardo Da Silveira Cabral, Zurich, CH;
Shreyas Saxena, Mountain View, CA (US);
Wenda Wang, Mountain View, CA (US);
Guanhang Wu, Santa Clara, CA (US);
Nitish Srivastava, San Francisco, CA (US);
Dimitrios Kottas, Sunnyvale, CA (US);
Cuneyt Oncel Tuzel, Cupertino, CA (US);
Luciano Spinello, Sunnyvale, CA (US);
Ricardo da Silveira Cabral, Zurich, CH;
Apple Inc., Cupertino, CA (US);
Abstract
A method includes obtaining training samples that include images that depict objects and annotations of annotated key point locations for the objects. The method also includes training a machine learning model to determine estimated key point locations for the objects and key point uncertainty values for the estimated key point locations by minimizing a loss function that is based in part on a key point localization loss value that represents a difference between the annotated key point locations and the estimated key point locations values and is weighted by the key point uncertainty values.