The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Jan. 14, 2020
Applicant:

Shanghai Zhaoxin Semiconductor Co., Ltd., Shanghai, CN;

Inventors:

Yi Li, Shanghai, CN;

Xiaojing Li, Shanghai, CN;

Miao Liu, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3312 (2020.01); G06F 30/367 (2020.01); G01R 31/28 (2006.01); G01R 31/30 (2006.01);
U.S. Cl.
CPC ...
G06F 30/3312 (2020.01); G01R 31/2882 (2013.01); G01R 31/30 (2013.01); G06F 30/367 (2020.01);
Abstract

A method for predicting an operation parameter of an integrated circuit includes the following steps. A plurality of cells used by the integrated circuit are provided. A voltage-frequency sweep test is performed on each of cells through a test model to generate a plurality of parameters, wherein the parameters correspond to a voltage value. A lookup table is established according to the parameters. A timing signoff corresponding to the integrated circuit is obtained. A timing analysis is performed on a plurality of timing paths of the integrated circuit according to the timing signoff and the parameters of the lookup table to obtain a critical timing path, and the operation parameter of the integrated circuit is predicted according to the critical timing path.


Find Patent Forward Citations

Loading…