The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Mar. 13, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Liana Liyow Fong, Yorktown Heights, NY (US);

Wei Tan, Yorktown Heights, NY (US);

Michael Witbrock, Yorktown Heights, NY (US);

Lingfei Wu, Yorktown Heights, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/80 (2006.01); G06N 20/00 (2019.01); G06F 15/76 (2006.01);
U.S. Cl.
CPC ...
G06F 15/80 (2013.01); G06F 15/76 (2013.01); G06N 20/00 (2019.01);
Abstract

A random binning featurization process method, system, and computer program product for a distributed random binning featurization process on one or more multicore systems with a hybrid two-level parallelism, the method including in a training phase, receiving a first data matrix dividing the random binning featurization process into two orthogonal levels, in a high-level generating a randomized number of high-dimension grids and evenly partitioning the grids into nodes in a parallel system, and in a low-level, evenly partitioning dimensions in each grid to construct look-up tables of index vectors and compute a local feature matrix for each node.


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