The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
May. 13, 2019
Jpmorgan Chase Bank, N.a., New York, NY (US);
Mark R Wilson, Bournemouth, GB;
Nicholas Johnston, Bournemouth, GB;
Pollawat Poonjiradejma, Bournemouth, GB;
Hani El Sayyed, London, GB;
Thomas Williams, Hong Kong, HK;
JPMORGAN CHASE BANK, N.A., New York, NY (US);
Abstract
A scalable enterprise platform for automated functional and integration regression testing is provided. Embodiments of the disclosed system facilitate the testing of any number of different software systems in development, even where the systems have unique dataset formats. Embodiments of the present invention provide a common method to generate logging and results reports across the platform, thereby providing simpler results analysis. Embodiments may also standardize the query set and facilitate the capability to analyze large results sets. Furthermore, embodiments of the disclosed system may combine the original data to the validated data to allow testers to analyze the testing results. In addition, embodiments of the present invention supports secured separation of testing domains. In at least one embodiment, the system includes a centralized user interface system that provides users with different domains to securely access one or more testing domains.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile