The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Feb. 07, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Mineyoshi Masuda, Tokyo, JP;

Katsunori Suzuki, Tokyo, JP;

Hironori Emaru, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01); G06F 11/3447 (2013.01); G06F 11/3452 (2013.01); G06F 11/3006 (2013.01); G06F 11/3495 (2013.01);
Abstract

An apparatus for monitoring a computer system includes a data collecting unit that collects performance data on a plurality of performance items related to the performance of the computer system; a performance degradation cause modelin which a cause event and degradation performance items which are one or more performance items degraded by the cause event are associated with one another; and an outlier score calculatorthat specifies a degree of deviation, when target performance data which is performance data of degradation performance items collected by the data collecting unit deviates from a normal range under a condition that the normal range of the performance data of the one or more degradation performance items for the cause event is predetermined, and outputs information on the cause event based on a temporal change in the degree of deviation.


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