The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Mar. 09, 2017
Applicants:

Pioneer Corporation, Tokyo, JP;

Nikkiso Company Limited, Tokyo, JP;

Inventors:

Tadashi Kondo, Kawagoe, JP;

Wataru Onodera, Kawagoe, JP;

Tomoya Murakami, Makinohara, JP;

Akari Agata, Makinohara, JP;

Genki Adachi, Makinohara, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/22 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0724 (2013.01); G06F 11/1641 (2013.01); G06F 11/2289 (2013.01);
Abstract

An information processing device is provided with: a first processing unit that generates first information by performing first processing with respect to sensor information acquired from a sensor; a second processing unit that generates second information by performing, with respect to the first information, second processing that is different from the first processing; and a third processing unit, which generates third information by performing, with respect to the first information, third processing, i.e., processing that corresponds to at least a part of the second processing, and which acquires the second information, and outputs the second information and the third information.


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Quick Actions:

Kondo, Tadashi. (2021). Information processing with failure detection, apparatus and method (U.S. Patent No. 11080119). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11080119

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