The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Oct. 24, 2016
Applicant:
City University of Hong Kong, Kowloon, HK;
Inventors:
Yajing Shen, Kowloon, HK;
Haojian Lu, Kowloon Tong, HK;
Assignee:
City University of Hong Kong, Kowloon, HK;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/32 (2006.01); G02B 21/26 (2006.01); G06T 7/73 (2017.01); G06T 7/13 (2017.01); G06T 7/246 (2017.01);
U.S. Cl.
CPC ...
G02B 21/32 (2013.01); G02B 21/26 (2013.01); G06T 7/13 (2017.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01); G06T 2207/10056 (2013.01);
Abstract
A method for use in optical imaging, a system for using in optical imaging, and an optical system includes a controller arranged to determine an intermediate position of a sample upon a detection of a completion of a first movement of the sample, and to derive an optimal position associated with the intermediate position; a manipulator arranged to move the sample from the intermediate position to the optimal position with a second movement; wherein the sample is arranged to be observed using an optical instrument in the optimal position.