The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Jun. 30, 2017
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventor:

Falk Schlaudraff, Butzbach, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01); G02B 21/0032 (2013.01);
Abstract

A laser microscope system includes a microscope and a lens defining an optical axis and a rear focal plane, as well as a laser and an optical laser system coupling a laser beam into the microscope such that it passes through the rear focal plane of the lens at a fixed point. The optical laser system has an offset lens movable along an axis of the laser beam path to move the laser beam focus in the direction of the optical axis. The optical laser system has a compensating lens arranged in the laser beam path and movable along the axis of the laser beam path. A controller and/or a mechanical coupling device carries out a movement of the compensating lens along the axis of the laser beam path when the lens is moved such that the laser beam continues to pass through the fixed point.


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