The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Nov. 26, 2018
Applicant:

Southwest Research Institute, San Anotnio, TX (US);

Inventor:

Thomas Howard Jaeckle, San Antonio, TX (US);

Assignees:

UHU Technologies, Richardson, TX (US);

Southwest Research Institute, San Antonio, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 19/21 (2010.01); G01S 19/01 (2010.01);
U.S. Cl.
CPC ...
G01S 19/215 (2013.01); G01S 19/015 (2013.01); G01S 19/21 (2013.01);
Abstract

A system and method for testing the integrity of signals incoming to a satellite navigation system. The method is implemented with an array of antenna elements, and a receiver connected to each antenna element. The receivers simultaneously and continuously make measurements on all tracked signals. Each receiver measures the carrier phase of an incoming signal. Based on the carrier phase differences between antenna elements and the distance between them, the azimuth and elevation of the signal source can be calculated. This measured angle of arrival can then be compared to an expected angle of arrival to determine if the signal source is legitimate. The system and method can be also applied to determining the angle of arrival of sources of interference, and to mitigating the effects of both illegitimate and interfering signals.


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