The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Jul. 10, 2018
Fondanzione Bruno Kessler, Trento, IT;
Daniele Perenzoni, Trento, IT;
David Stoppa, Trento, IT;
Leonardo Gasparini, Trento, IT;
Matteo Perenzoni, Trento, IT;
Nicola Massari, Trento, IT;
Ulrich Zwölfer, Trento, IT;
Kai Waslowski, Trento, IT;
Alexander Bohli, Trento, IT;
Michael Albert, Trento, IT;
Friedhelm Wiethege, Trento, IT;
FONDAZIONE BRUNO KESSLER, Trento, IT;
Abstract
Measuring device () suited to measure the distance (d) of a reference object (O), configured so that it performs a plurality of measuring operations (A) in succession and comprising emission means () suited to emit a light radiation (R), receiving means () comprising a sensitive area () which is sensitive to the light radiation (R) and which is provided with a number M of sensitive units (), each one of the sensitive units () being configured to generate an electrical signal (S), a first processing unit () comprising Nprocessing elements (), each one of said Nprocessing elements () being configured to receive the electrical signal (S) for determining the time of impact (t) of a photon (F) on the sensitive units () and for calculating the value of said distance (d). The measuring device () comprises a second processing unit () configured to receive the electrical signals (S), processing the electrical signals (S) in such a way as to select a number Nof sensitive units () impacted by the photons (F), associating each one of the Nsensitive units () to one of the Nprocessing elements (), in such a way that, at the moment of the successive measuring operation (A), the distance (d) is determined by each one of the Nsensitive units () selected.