The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Feb. 26, 2018
Applicant:
Nxp B.v., Eindhoven, NL;
Inventors:
Abdellatif Zanati, Hamburg, DE;
Holger Mahnke, Hohenwestedt, DE;
Assignee:
NXP B.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2886 (2013.01); G01R 1/045 (2013.01); G01R 31/2896 (2013.01); G01R 31/2851 (2013.01);
Abstract
An ATE testing system () for millimetre wave (mmW) packaged integrated circuits () includes: at least one packaged integrated circuit (); a radio frequency, RF, socket () configured to receive the at least one packaged integrated circuit () and facilitate routing RF signals thereto via at least one input connector and at least one output connector; and at least one interface configured to couple a tester to at least one packaged integrated circuit (). The RF socket () includes a mmW absorber () located adjacent the at least one output connector of the RF socket ().