The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Jun. 07, 2018
Wuhan University, Hubei, CN;
Yigang He, Hubei, CN;
Yuan Huang, Hubei, CN;
Hui Zhang, Hubei, CN;
Bing Li, Hubei, CN;
Baiqiang Yin, Hubei, CN;
Jiajun Duan, Hubei, CN;
WUHAN UNIVERSITY, Hubei, CN;
Abstract
A system for testing a Nakagami fading channel and a verification method thereof are provided. The testing system includes a signal generator, a Nakagami fading channel simulator, and a computer. The signal generator is used to output a sine wave signal whose frequency is f and transmit the sine wave signal to the Nakagami fading channel simulator and the computer. The Nakagami fading channel simulator is used to generate a Nakagami fading channel. The computer is used to perform data processing and analysis. In the verification method, time domain fading characteristics, first-order statistics characteristics, and second-order statistics characteristics of the Nakagami fading channel are respectively verified. Verifying the time domain fading characteristics is verifying a waveform fluctuation rate and a fluctuation range on a time domain under different Nakagami fading factors. Verifying the first-order statistics characteristics is mainly verifying amplitude and phase distribution statistics characteristics of the Nakagami fading channel by means of Kolmogorov Smirnov (KS) hypothesis test. Verifying the second-order statistics characteristics is mainly verifying the shape and bandwidth of a power spectrum density function. In the present invention, verification on performance of the Nakagami fading channel simulator or a simulation model has features of accuracy and feasibility.