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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11079357 B1

PDFFull Text
Date of Patent:
Aug. 03, 2021

Filed:

Mar. 26, 2018

Method and apparatus for enhanced visualization of anomalies in a structure

Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Jeong-Beom Ihn, Bellevue, WA (US);

Jung-Ryul Lee, Daejeon, KR;

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:

Ostrager Chong Flaherty & Broitman P.C.

Primary Examiner:

Ryan D Walsh

Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01N 29/24 (2006.01); G01N 29/04 (2006.01); G01N 29/265 (2006.01); G01N 21/17 (2006.01); G01N 19/08 (2006.01); G01M 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 29/069 (2013.01); G01M 5/0033 (2013.01); G01N 19/08 (2013.01); G01N 21/1702 (2013.01); G01N 29/043 (2013.01); G01N 29/0672 (2013.01); G01N 29/2418 (2013.01); G01N 29/265 (2013.01); G01N 2021/1706 (2013.01); G01N 2291/017 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/2632 (2013.01);
Abstract

Methods and apparatus for enhanced visualization of anomalies in a structure. The method comprises: acquiring pulse-echo laser ultrasonic wave propagation imaging video data at a multiplicity of points in a scan area on a surface of a structure; post-processing the pulse-echo laser ultrasonic wave propagation imaging video data using multiple-time window amplitude mapping to create a multiple-time window amplitude map; and displaying the multiple-time window amplitude map on a graphical user interface.

Find Patent Forward Citations

Ihn, Jeong-Beom. (2021). Method and apparatus for enhanced visualization of anomalies in a structure (U.S. Patent No. 11079357). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11079357

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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