The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Jun. 04, 2020
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Megan Cheney, Tucson, AZ (US);
David J. Markason, Tucson, AZ (US);
Christopher Janich, Tucson, AZ (US);
Assignee:
RAYTHEON COMPANY, Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01N 2201/0633 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/06113 (2013.01);
Abstract
Methods and systems for calculating a reflectance value of a reflective coating on a curved surface of an optical element include calculating the reflectance value by taking a series of photon count measurements of an extended radiation source over a range of values of emitted radiation reflected from the curved surface into a detector. A combination of the measurements and a known value of accepted or conforming reflectance for the reflective coating is used to calculate the reflectance value of the reflective coating on the curved surface.