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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11079290 B1

PDFFull Text
Date of Patent:
Aug. 03, 2021

Filed:

Jul. 10, 2017

Contact force measurement method

Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Yoichi Iwamoto, Tokyo, JP;

Masaaki Katayama, Tokyo, JP;

Assignee:

MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;

Attorney:

Westerman, Hattori, Daniels & Adrian, LLP

Primary Examiner:

Alexander A Mercado

Int. Cl.
CPC ...
G01L 1/00 (2006.01); G01L 1/25 (2006.01); F22B 37/00 (2006.01); G01N 27/72 (2006.01); G01L 5/00 (2006.01); G21C 17/003 (2006.01); G21D 1/00 (2006.01); G01N 27/90 (2021.01); G01B 17/02 (2006.01); G01N 29/11 (2006.01);
U.S. Cl.
CPC ...
G01L 1/255 (2013.01); F22B 37/003 (2013.01); G01B 17/02 (2013.01); G01L 1/00 (2013.01); G01L 1/005 (2013.01); G01L 5/0033 (2013.01); G01N 27/72 (2013.01); G01N 27/90 (2013.01); G01N 29/11 (2013.01); G21C 17/003 (2013.01); G21D 1/00 (2013.01); Y02E 30/30 (2013.01);
Abstract

There is provided a method for measuring a contact force applied to each tube constituting a tube bundle disposed in a fluid from a vibration damping member by using a probe inserted into each tube. Characteristic data defining a relationship between a value measured by the probe and the contact force is previously prepared. Then, the probe is inserted into the tube, and the contact force is calculated using the measurement value of the probe, based on the characteristic data.

Find Patent Forward Citations

Iwamoto, Yoichi. (2021). Contact force measurement method (U.S. Patent No. 11079290). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11079290

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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