The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Jan. 23, 2019
Applicant:

Precitec Gmbh & Co. KG, Gaggenau, DE;

Inventors:

Rüdiger Moser, Malsch, DE;

Martin Schönleber, Aschaffenburg, DE;

Assignee:

PRECITEC GMBH & CO. KG, Gaggenau, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/22 (2006.01); G01B 9/02 (2006.01); H01S 3/10 (2006.01); B23K 26/03 (2006.01); G02B 27/10 (2006.01); B23K 26/70 (2014.01); B23K 26/24 (2014.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/22 (2013.01); B23K 26/032 (2013.01); B23K 26/24 (2013.01); B23K 26/705 (2015.10); G01B 9/02044 (2013.01); G01B 9/02091 (2013.01); G02B 27/10 (2013.01); H01S 3/10023 (2013.01); A61B 5/0066 (2013.01);
Abstract

The present disclosure concerns a device for distance measurement for a laser processing system. The device comprises a light source, which is configured to generate a primary beam for direction onto a workpiece, at least one detection device configured to record a secondary beam reflected from the workpiece, at least one optical amplifier configured to amplify the primary beam and/or the secondary beam, and an evaluation unit configured to evaluate interference between spectral components in the frequency domain.


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