The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Nov. 22, 2017
Applicant:

Qingdao Haier Joint Stock Co., Ltd., Qingdao, CN;

Inventors:

Chunyang Li, Qingdao, CN;

Ming Wang, Qingdao, CN;

Jianlin Miao, Qingdao, CN;

Sen Mou, Qingdao, CN;

Bintang Zhao, Qingdao, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F25D 29/00 (2006.01);
U.S. Cl.
CPC ...
F25D 29/005 (2013.01); F25D 29/008 (2013.01); F25D 2700/06 (2013.01); F25D 2700/16 (2013.01);
Abstract

A method for detecting whether an article with an abnormal temperature is placed in a refrigerator. The method includes: controlling a plurality of infrared sensors to collect temperature values after a door body is opened; determining whether an abnormal storage space in which the article with the abnormal temperature is possibly placed exists in a plurality of storage spaces; acquiring a first temperature change value of the abnormal storage space between time points before and after the article with the abnormal temperature is possibly placed in the abnormal storage space and a second temperature change value of the abnormal storage space caused by heat exchange between an external environment and the abnormal storage space between said time points; and determining whether the article with the abnormal temperature is placed in the abnormal storage space according to the first temperature change value and the second temperature change value.


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