The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Mar. 29, 2012
Applicants:
Jong Yoon Chun, Seoul, KR;
Young JO Lee, Seoul, KR;
Inventors:
Jong Yoon Chun, Seoul, KR;
Young Jo Lee, Seoul, KR;
Assignee:
SEEGENE, INC., Seoul, KR;
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C12Q 1/6823 (2018.01); C12Q 1/6834 (2018.01); C12Q 1/6853 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6823 (2013.01); C12Q 1/6834 (2013.01); C12Q 1/6853 (2013.01);
Abstract
The present invention relates to the detection of a target nucleic acid sequence by a PCEC (PTO Cleavage and Extension-Dependent Cleavage) assay. The present invention is characterized by generating a cleavage site for a nucleolytic enzyme on the extended duplex of which the formation is dependent on the presence of a target nucleic acid sequence. The present invention detects the occurrence of the cleavage of the extended duplex, thereby determining the presence of the target nucleic acid sequence.