The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Feb. 12, 2019
Applicants:

Varian Medical Systems, Palo Alto, CA (US);

Varian Medical Systems Particle Therapy Gmbh, Troisdorf, DE;

Inventors:

John R. Adler, Jr., Stanford, CA (US);

Ralf Bruder, Lubeck, DE;

Floris Ernst, Lubeck, DE;

Achim Schweikard, Lubeck, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/107 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 90/00 (2016.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1079 (2013.01); A61B 5/0035 (2013.01); A61B 5/0064 (2013.01); A61B 5/0075 (2013.01); A61B 5/1075 (2013.01); A61B 5/441 (2013.01); A61B 5/4504 (2013.01); A61B 5/4836 (2013.01); A61B 5/4887 (2013.01); A61B 6/5247 (2013.01); A61B 5/055 (2013.01); A61B 5/72 (2013.01); A61B 6/032 (2013.01); A61B 6/501 (2013.01); A61B 6/505 (2013.01); A61B 2090/061 (2016.02);
Abstract

A method for measuring skin thickness. The method includes at a first 3D point on an outer surface of a patient, exposing the first point to near infrared (NIR) energy from an NIR source. The method includes measuring reflected energy emanating near the first 3D point, or beam incident point. The method includes determining a pattern of the reflected energy based on a distance from a center of the reflected energy, wherein the center is approximated by the first 3D point. The method includes determining a skin thickness measurement based on the pattern.


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