The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Jul. 10, 2020
Applicant:

Newracom, Inc., Lake Forest, CA (US);

Inventors:

Ryunwoo Kim, Yongin, KR;

Seungyun Lee, Irvine, CA (US);

Jaeyoung Ryu, Irvine, CA (US);

Jeongki Choi, Lake Forest, CA (US);

Jonghoon Park, Seoul, KR;

Changhun Song, Seoul, KR;

Assignee:

NEWRACOM, Inc., Lake Forest, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/40 (2006.01);
U.S. Cl.
CPC ...
H03M 1/403 (2013.01); H03M 1/1033 (2013.01);
Abstract

A method is described that is performed by a calibration system. The method includes determining a set of perturbation values for configuring an analog-to-digital converter of the calibration system; generating a set of digital test values for determining the accuracy of the analog-to-digital converter; and applying the set of perturbation values to the set of digital test values to generate a set of modified test values, wherein the set of perturbation values are digital values that are applied to the set of digital test values in the digital domain.


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