The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Feb. 23, 2018
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Francesco Michielin, Stuttgart, DE;

Roderick Köehle, Munich, DE;

Fredrik Mattisson, Lund, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 17/20 (2006.01); G06T 7/55 (2017.01); G06T 3/00 (2006.01); G06T 5/20 (2006.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 3/0093 (2013.01); G06T 5/20 (2013.01); G06T 7/55 (2017.01); G06T 2200/08 (2013.01);
Abstract

A method of generating a refined depth map for a three-dimensional (3D) model of an object is described. The method may include may include warping a set of target images, resulting in warped target images, wherein the set of target images is selected from the plurality of images; determining a difference between each warped target image and a reference image, wherein the reference image is from the plurality of images; determining, for each warped target image, an alpha mask comprising per-pixel weights; and updating an initialized depth map based on alpha mask, resulting in the estimated depth map. Related systems, devices and computer program products are also described.


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