The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Feb. 07, 2020
Applicant:

Aptiv Technologies Limited, St. Michael, BB;

Inventors:

Yew Kwang Low, Singapore, SG;

Ronald M. Taylor, Greentown, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); H04N 17/00 (2006.01); G06T 7/70 (2017.01); G02B 27/30 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G02B 27/30 (2013.01); G06T 7/70 (2017.01); H04N 17/002 (2013.01);
Abstract

A method of calibrating intrinsic parameters associated with a camera includes positioning a camera to receive collimated light from a rotatable collimator, wherein the collimated light is provided to the camera via a target having a central target aperture and a plurality of peripheral target apertures located on a periphery of the target. The method further includes rotating the collimator along a first axis extending through an entrance pupil location of the camera and recording spot positions associated with collimated light provided through one or more target apertures of the target at each first axis interval and determining a distortion profile associated with the camera based on the recorded spot positions measured at the plurality of first axis intervals.


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