The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Dec. 04, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aly S. Megahed, San Jose, CA (US);

Hamid R. Motahari Nezhad, San Jose, CA (US);

Peifeng Yin, State College, PA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06Q 10/10 (2012.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06313 (2013.01); G06F 17/18 (2013.01); G06Q 10/103 (2013.01);
Abstract

One embodiment provides a method comprising mapping project attributes for past projects to a first parameter set associated with a first model that models distribution of event types of project events, and a second parameter set associated with a second model that models distribution of the time intervals of project events. Specifically, machine learning is applied to a set of historical data for the past projects to obtain a first and a second set of learned weights. The method further comprises predicting information relating to a next project event for an ongoing project by generating a first probability distribution for a set of possible event types for the next project event utilizing the first model, and, for each possible event type, generating a corresponding probability distribution for time intervals of occurrence of the possible event type utilizing the first model and the second model in a pipelined fashion.


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