The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Jan. 13, 2016
Applicant:

Paypal Inc., San Jose, CA (US);

Inventors:

Dhanurjay A. S. Patil, Atherton, CA (US);

Grahame Andrew Jastrebski, San Jose, CA (US);

Allison E. Miller, Mountain View, CA (US);

Chris Riccomini, Saratoga, CA (US);

Assignee:

PayPal, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2006.01); G06K 9/62 (2006.01); G06Q 30/02 (2012.01); G06N 5/02 (2006.01); G06N 3/12 (2006.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 5/047 (2013.01); G06K 9/6253 (2013.01); G06N 3/126 (2013.01); G06N 5/022 (2013.01); G06N 20/00 (2019.01); G06Q 30/02 (2013.01); G06N 3/049 (2013.01); G06N 3/0436 (2013.01); G06N 3/0445 (2013.01); G06N 3/0454 (2013.01); G06N 3/0472 (2013.01); G06N 3/088 (2013.01); G06N 7/005 (2013.01);
Abstract

In some example embodiments, a system and method are provided for graph pattern analysis. In example embodiments, pattern data of a primary network that includes data relating to relationships between entities are received. A reference matrix comprising a plurality of secondary network determined based on the pattern data of the primary network is generated. A graphical display of the primary network and the reference matrix are displayed on a user interface. A selection of a secondary network from the plurality of secondary networks of the reference matrix is received. The selected secondary network has similar matching characteristics with at least a portion of the primary network. In response to the selection, the primary network is classified as a classification type related to the selected secondary network.


Find Patent Forward Citations

Patil, Dhanurjay A. S.. (2021). System and method for graph pattern analysis (U.S. Patent No. 11074511). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11074511

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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