The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2021
Filed:
Dec. 01, 2017
International Business Machines Corporation, Armonk, NY (US);
Jim A. Laredo, Katonah, NY (US);
Aleksander Slominski, Riverdale, NY (US);
John E. Wittern, New York, NY (US);
Annie T. Ying, Vancouver, CA;
Christopher C. Young, Kitchener, CA;
Yunhui Zheng, Elmsford, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer implemented method for testing an application according to usage data includes receiving an application to be tested and a set of usage data corresponding to the application to be tested, wherein the set of usage data corresponds to previously executed code sequences, identifying one or more code sequences of interest corresponding to the received application, wherein the code sequences of interest correspond to codes sequences that are configured to exercise the received application, extracting concrete usages of the code sequence of interest from the received set of usage data, generating one or more test cases for the application according to the extracted usages, and providing the one or more generated test cases. The method may additionally include testing the application according to the one or more generated test cases.