The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11074155 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 27, 2021

Filed:

Apr. 04, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Alper Buyuktosunoglu, White Plains, NY (US);

Ramon Bertran Monfort, New York, NY (US);

Calvin Bulla, Barcelona, ES;

Pradip Bose, Yorktown Heights, NY (US);

Hubertus Franke, Cortlandt Manor, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01);
Abstract

Embodiments for generating representative microbenchmarks in a computing environment are provided. One or more tracing points may be selected in a target application. Executed instructions and used data of the target application may be dynamically traced according to the one or more tracing points according to a tracing plan. Tracing information of the dynamic tracing may be replicated in an actual computing environment and a simulated computing environment.


Find Patent Forward Citations

Buyuktosunoglu, Alper. (2021). Generating representative microbenchmarks (U.S. Patent No. 11074155). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11074155

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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