The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2021
Filed:
Dec. 16, 2019
Applicant:
Western Digital Technologies, Inc., San Jose, CA (US);
Inventor:
Guangming Lu, Irvine, CA (US);
Assignee:
Western Digital Technologies, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 29/52 (2006.01); G06F 3/06 (2006.01); G06F 12/02 (2006.01); G11C 16/08 (2006.01); H03M 13/11 (2006.01); H03M 13/37 (2006.01); H03M 13/45 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1048 (2013.01); G06F 11/1004 (2013.01); G06F 11/1072 (2013.01); G11C 29/52 (2013.01); G06F 3/0679 (2013.01); G06F 3/0688 (2013.01); G06F 11/1068 (2013.01); G06F 12/0246 (2013.01); G11C 16/08 (2013.01); H03M 13/1111 (2013.01); H03M 13/3784 (2013.01); H03M 13/45 (2013.01);
Abstract
An error management system for a data storage device can generate soft-decision log-likelihood ratios (LLRs) using multiple reads of memory locations. 0-to-1 and 1-to-0 bit flip count data provided by multiple reads of reference memory locations can be used to generate probability data that is used to generate possible LLR values for decoding target pages. Possible LLR values are stored in one or more look-up tables.